1. | Ruterana P.♦, Singh P.♦, Kret S.♦, Cho H.K.♦, Lee H.J.♦, Suh E.K.♦, Jurczak G., Maciejewski G., Dłużewski P., Size and shape of In rich clusters and InGaN QWs at the nanometer scale, IWN 2004, International Workshop on Nitrides Semiconductors, 2004-06-19/06-23, Pittsburgh (US), DOI: 10.1002/pssc.200461463, Vol.2, No.7, pp.2381-2384, 2005Abstract:Following the need to accurately understand the In composition fluctuations and their role on the optical properties of the GaN based heterostructures, an investigation of MOCVD InGaN/GaN quantum wells is carried out. To this end, quantitative High Resolution Transmission Electron Microscopy (HRTEM) is coupled with image simulation and Finite Element Method (FEM) for the thin foil relaxation modelling. The results show that the indium content can reach x = 1 in the clusters inside the core. In these MOCVD QWs, we attempt to connect the Quantum dot density, composition, and shape to the growth conditions, in order to help the engineering process of highly efficient devices. Affiliations:Ruterana P. | - | CNRS (FR) | Singh P. | - | CNRS (FR) | Kret S. | - | Institute of Physics, Polish Academy of Sciences (PL) | Cho H.K. | - | Dong-A University (KR) | Lee H.J. | - | Chonbuk National University (KR) | Suh E.K. | - | Chonbuk National University (KR) | Jurczak G. | - | IPPT PAN | Maciejewski G. | - | IPPT PAN | Dłużewski P. | - | IPPT PAN |
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