1. | Dłużewski P., Jurczak G., Maciejewski G., Kret S.♦, Ruterana P.♦, Nouet G.♦, Finite Element Simulation of Residual Stresses in Epitaxial Layers, Materials Science Forum (MSF), ISSN: 1662-9752, DOI: 10.4028/www.scientific.net/MSF.404-407.141, Vol.404-407, pp.141-146, 2002Abstract:A nonlinear finite element approach presented here is based on the constitutive equations for anisotropic hyperelatic materials. By digital image processing the elastic incompatibilities (lattice mismatch) are extracted from the HRTEM image of GaN epilayer. Such obtained tensorial field of dislocation distribution is used next as the input data to the FE code. This approach is developed to study the stress distribution associated with lattice defects in highly mismatched heterostructures applied as buffer layers for the optically active structures. Keywords:Dislocations, Anisotropic Hyperelasticity, Residual Stresses Affiliations:Dłużewski P. | - | IPPT PAN | Jurczak G. | - | IPPT PAN | Maciejewski G. | - | IPPT PAN | Kret S. | - | Institute of Physics, Polish Academy of Sciences (PL) | Ruterana P. | - | CNRS (FR) | Nouet G. | - | CNRS (FR) |
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