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Ostatnie publikacje
1. | Tytko G.♦, Adamczyk-Habrajska M.♦, Linke Y.♦, Liu Z.♦, Kopeć M., High frequency eddy current method in inspection of aluminide coatings integrity after simulating service loads, MEASUREMENT, ISSN: 0263-2241, DOI: 10.1016/j.measurement.2025.117356, Vol.252, No.117356, pp.1-11, 2025![]() Streszczenie: This study investigates the use of high-frequency eddy current testing (ECT) to assess the structural integrity of aluminide coatings on MAR-M247 nickel superalloy under simulated fatigue conditions. Aluminide coatings, deposited via chemical vapor deposition at thicknesses of 20 µm and 40 µm, were tested using custom-designed probes optimized for defect detection. Results demonstrate that substrate grain structure and coating thickness significantly influence coating durability, with fine-grain substrates exhibiting the least resistance changes and greatest fatigue tolerance. Eddy current signal variations correlated with microstructural changes, enabling detection of damage otherwise invisible to traditional methods. These findings establish ECT as a precise, non-destructive approach for monitoring aluminide coatings in critical applications. Słowa kluczowe: Nickel alloys, Aluminide coating, Non-destructive testing, Eddy current testing Afiliacje autorów:
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2. | Abetkovskaya S.O.♦, Chizhik S.A.♦, Pogoskaya I.V.♦, Rimuza Z.♦, Jarząbek D.M.♦, Mikhalovski M.♦, Linke Ya.♦, Determining the Young Modulus of Nanosize Thickness Coatings for MEMS from the Results of Static Force Spectroscopy, Bulletin of the Russian Academy of Sciences: Physics, ISSN: 1062-8738, DOI: 10.3103/S1062873812090031, Vol.76, No.9, pp.1009-1011, 2012![]() Streszczenie: A method for the nanoidentation of resistance coatings 1–100 nm thick and intended for use in microelectromechanical systems is proposed on the basis of atomic-force microscopy (AFM). The elastic moduli of the coatings are determined using three models of contact: the Hertz model, the Johnson–Kendall–Roberts model and the Makushkin model, with and without allowance for the influence of a solid substrate Afiliacje autorów:
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